Information Request Form

Request up to four datasheets

• F3-CS : Measure Small Witness or Coupon Samples
• F3-sX : Spectral Reflectometers for Measuring Very Thick Layers
• F10-AR : Anti-Reflection Coating Measurements
• F10-ARc : Anti-Reflection Coating Measurements
• F10-HC : Hardcoat Thickness Measurement Tool
• F10-RT : Measure Reflectance and Transmittance
• F20 : Tabletop Film Thickness Measurement System
• F30 : In-Situ Thickness Measurement Instrument
• F32 : In-Line Thickness Measurement System
• F32-sX : In-Line Thickness Measurement System 15nm to 3mm
• F40 : Microscope-based Film Thickness Measurements
• F50 : Thin Film Thickness Mapper
• F54 : Automated Thin-Film Thickness Mapper
• F54-XY : F54-XY-200_short_desc
• F60-t : Automated Thin Film Thickness Mapper
• F60-c : Automated Thin Film Thickness Mapper
• Profilm3D : 3D Optical Profiler
• R50 : R50_short_desc
• TS-SiO2-6-Multi : Multi-Value Thickness Standard

Request up to four application notes

• Automotive Coatings
• Display Layers on ITO
• Failure Analysis
• Medical Devices
• MEMS-Si
• OLED Displays
• Ophthalmic Coatings
• Parylene Coatings
• Porous Semiconductors
• SU-8 Photoresist