Semiconductor Fabrication Teaching Labs

thin film labs

More than fifty Filmetrics F20s have been delivered to universities for use in Semiconductor Fabrication teaching labs. This isn't just because they are quick, reliable, and affordable. It's also because their straightforward design makes them the ideal platform for teaching the principles of spectral reflectance. (If you'd like to get an idea of how F20s are being used in teaching labs, try Googling the terms Filmetrics University.) Also, since thousands of F20s are in use around the world, this gives the students training that they will likely find useful in industry.

Filmetrics offers special discounts to universities for instruments that are used in lab courses.

To discuss semiconductor-teaching-lab applications, contact our thin-film experts.

Filmetrics offers free trial measurements - results are typically available in 1-2 days.

Contact Us Now

We love talking about thin films, so we’ll reply in just a minute or two (M-F).

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  • Amorphous & Polysilicon

    Measure thickness, crystallinity, and n and k of all forms of amorphous and polycrystalline silicon.

  • CMP

    Our F80 Thickness Imaging products are used to measure oxide, STI, and metal CMP processes.

  • Dielectrics

    Filmetrics stocks instruments that measure the thousands of dielectric films used throughout industry.

    CVD, dielectrics, barrier, PECVD, passivation, insulator, protection, Al2O3, CoO, ZnO, MoO, TiO2, Cr2O3, Nb2O5

  • Hardcoat Thickness

    Filmetrics systems are used widely in the automotive industry to verify hardcoat and primer thickness.

    Acrylic, Automotive industry, Chemical resistance, Clear coating, Decorative coating, Hardcoat, Eyewear, Face shield, Hardcoat, Hardness, Interpenetration Layer, Marring, Ophthalmic lens, Optical quality, Plastic lens, Polycarbonate, Polyester, Siloxane, Primer, Protective film, Scratch resistant, Screen protection, Surface finish, Surface protection, Thermal cure, Top coating, Touch screen, UV coating, UV cure

  • IC Failure Analysis

    The F3-sX is used throughout the chip making industry to measure backside thinning of silicon.

    Failure Analysis, FA, Silicon, Si, Integrated circuit, IC, Polishing, Backside failure analysis, Silicon thinning

  • ITO & Other TCOs

    Proprietary analysis algorithms allow one-click measurement of TCO thickness, index, and k.

    Indium tin oxide, ITO, tin-doped indium oxide, Transparent conductive oxide, TCO, Display, Front contact, Transparent Electrode, LED, LCD, Solar, Fluorine-doped tin oxide, FTO, TEC, TEC glass, Aluminum zinc oxide, AZO, Aluminum-doped zinc oxide, Zinc oxide, iZO, Indium zinc oxide, IZO, zinc-doped indium oxide

  • Medical Devices

    Measure thickness of angioplasty balloons, stent and implant coatings, and many others.

    Stents, drug-coated stents, Drug-coating, Balloons, Angioplasty, Parylene, Microfluidic device, Air gap, Catheter, Membranes

  • Metal Thickness

    Measure thickness, index, and k of metal films up to 50nm thick.

    Metallized, Metallization, Foils, Stents, Mirrors, Steel, Stainless Steel, Gold, Nickel, Aluminium, Silver, Cobalt, Zinc, Molybdenum, Titanium, Chrome, Chromium, Niobium, Tungsten, Gallium, Germanium

  • OLEDs

    Measure thickness and index of NPB, AlQ3, PEDOT, P3HT, soluble Teflons, etc…

    PLED, AMOLED, Hole Transport (HT), Hole Injection Layer (HIL), Host Materials, anode, cathode, Alq3, NPB, phenylene vinylene, carbazole, thiophene, aniline, styrenesulfonate, phthalocyanine, naphthalene, fluorene, lithium, silver, ITO, calcium

  • Ophthalmic Coatings

    Use the F10-AR to measure reflectance and color, as well as AR and hardcoat layer thicknesses.

    eyeglasses, HC, hardcoat, scratch resistant, AR, anti-reflection, reflectance, UV curable, hydrophillic, polycarbonate, high index, CR39, MR-6, MR-7, Trivex

  • Parylene Coatings

    Simply set your parylene-coated sample on the stage of the F3-CS to measure its thickness!

    Conformal

  • Photoresist

    We’ve measured dozens of different resists, and can generate index files for any resist you use.

    SU-8, resist, Photoresist, PR, AZ, AZP, ZEP, positive, negative, g-line, i-line, KrF, PMMA, FEP, GRX, KMPR

  • Porous Silicon

    Measure thickness, porosity, refractive index, and k of your porous silicon films.

  • Process Films

    Filmetrics offers a full range of products for measuring semiconductor process films.

  • Refractive Index & k

    Measure refractive index and extinction coefficient over wavelengths as wide as 190-1700nm.

    n & k, complex, real , imaginary, refractive index, absorption, extinction coefficient, indices, Kramers-Kronig, optical dispersion, dielectric, Lorentz, Cauchy, photoresist, anomalous dispersion, path length

  • Silicon Wafers & Membranes

    We offer tabletop, mapping, and production systems for measuring silicon up to 2mm thick.

  • Solar Applications

    Measure CdTe, CdS, CIGS, amorphous-Si, TCOs, anti-reflection (AR) layers, and more...

    Copper indium gallium diselenide, CIGS, Cadmium telluride, CdTe, Cad tel,, Amorphous silicon, Amorphous Si, a-Si, Cadmium sulfide, CdS, window layer, buffer layer, Thin-film photovoltaic, Thin-film PV, TFPV, photovoltaics, Solar, Solar cells, Inline, In-situ, Roll-to-roll, R2R, Evaporation, Sputtering, CVD, MOCVD, PECVD, Transparent conductive oxide, TCO, Indium tin oxide, ITO, tin-doped indium oxide

  • Semiconductor Teaching Labs

    More than fifty Filmetrics F20s have been delivered for use in university teaching labs.

  • Web Coatings

    Filmetrics systems are widely used in the polymer-films community to measure thickness in-line.

    Roll to roll, Roll measurements, Roll systems, Rolling substrate, Roll fed, Roll web, Reel to reel , R2R, Web coater, Autoweb, In-line, In-line monitor, Online thickness, Line monitoring system, Precision measuring tools, Automatic, Feeding, Production, Multipoint, High speed