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What do you want to measure?

Do you have a preferred wavelength range?

What's the thinnest layer you want to measure?

What's the thickest layer you want to measure?

Do you have a spot size constraint?

Are any of your samples curved?

Do you want a real-time image of your sample?

Optical Profilers Model Thickness
Range		 Field-of-View Spatial
Sampling

Profilm3D

Step-height and surface roughness measurements
Features: VIS and PSI measurement capabilities. 100mm of motorized X, Y, and Z translation. Tip/Tilt Stage.
* With 10X objective lens.
Profilm3D 0.001-500 µm 2.0 x 1.7 mm * 0.88 µm *
Single-Spot
Measurements		 Model Thickness
Range		 Wavelength
Range		 Standard
Spot Size

F10-AR

Reflectance measurement of large flat or curved samples
Features: Handheld probe for large samples and maximum versatility.
* Thickness measurement capability is optional.
F10-AR 0.2-15 µm * 380-1050 nm 100 μm
Single-Spot
Measurements		 Model Thickness
Range		 Wavelength
Range		 Standard
Spot Size

F40

Microscope-based thin-film measurement system
Features: Attach to a microscope. Very small spot size.
F40 0.02-20 µm 400-850 nm 1 μm
F40-EXR 0.02-40 µm 400-1700 nm 1 μm
F40-NIR 0.04-40 µm 950-1700 nm 1 μm
F40-UV 0.004-40 µm 190-1100 nm 7 μm
F40-UVX 0.004-40 µm 190-1700 nm 7 μm