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Single-Spot Measurements	Model	Thickness Range	Wavelength Range	Standard Spot Size
F3	Reflectance and film-thickness measurements Features: Compact, low-cost, non-UV systems have 40k-hour light source. * Thickness measurement capability is optional.
	F3-s980	10-1000 µm *	960-1000 nm	10 μm
	F3-s1310	15-2000 µm *	1280-1340 nm	10 μm
	F3-s1550	25-3000 µm *	1520-1580 nm	10 μm

In-line Measurements	Model	Thickness Range	Wavelength Range	Standard Spot Size
F32	Compact solution for in-line measurements Features: Includes spectrometer(s), software, and 10k-hour light source.
	F32-s980	10-1000 µm *	960-1000 nm	10 μm
	F32-s1310	15-2000 µm *	1280-1340 nm	10 μm
	F32-s1550	25-3000 µm *	1520-1580 nm	10 μm

Multi-Point Mapping	Model	Thickness Range	Wavelength Range	Standard Spot Size
F50	Measures thickness etc. at two points/second Features: Sample chucks (up to 300mm) sold separately.
	F50-s980	4-1000 µm	960-1000 nm	10 μm
	F50-s1310	7-2000 µm	1280-1340 nm	10 μm
	F50-s1550	10-3000 µm	1520-1580 nm	10 μm
F60-t	Production-oriented film thickness mapping Features: Includes notch-finding, on-board baselining, and safety interlock.
	F60-t-s980	4-1000 µm	960-1000 nm	10 μm
	F60-t-s1310	7-2000 µm	1280-1340 nm	10 μm
	F60-t-s1550	10-3000 µm	1520-1580 nm	10 μm